| Scanning Probe Microscopy of Soft Matter |  | Authors: Vladimir V. Tsukruk, Srikanth Singamaneni
Publisher: Wiley-VCH
Category: Book
List Price: $165.00
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Sales Rank: 2,121,834
Languages: English (Unknown), English (Original Language), English (Published)
Media: Hardcover
Edition: 1
Pages: 661
Number Of Items: 1
Shipping Weight (lbs): 2
Dimensions (in): 9.7 x 6.7 x 0.9
ISBN: 3527327436
EAN: 9783527327430
ASIN: 3527327436
Publication Date: December 27, 2011
Availability: Usually ships in 1-2 business days
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Product Description
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy,
showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide
range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning.
This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy
in soft matter research.
From the contents:
* Atomic Force Microscopy and Other Advanced Imaging Modes
* Probing of Mechanical, Thermal Chemical and Electrical Properties
* Amorphous, Poorly Ordered and Organized Polymeric Materials
* Langmuir-Blodgett and Layer-by-Layer Structures
* Multi-Component Polymer Systems and Fibers
* Colloids and Microcapsules
* Biomaterials and Biological Structures
* Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography
* Microcantilever-Based Sensors
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