| Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging Analysis |  | Author: Nobuo Tanaka
Publisher: Imperial College Press
Category: Book
Buy New: $128.00
as of 5/27/2012 11:58 EDT details
Seller: Amazon.com
Sales Rank: 6,456,335
Languages: English (Unknown), English (Original Language), English (Published)
Media: Hardcover
Pages: 400
Number Of Items: 1
Shipping Weight (lbs): 0
Dimensions (in): 0 x 0 x 0
ISBN: 184816789X
EAN: 9781848167896
ASIN: 184816789X
Publication Date: September 30, 2012 (In 126 Days)
Shipping: Eligible for FREE Super Saver Shipping
Availability: Not yet published
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Product Description
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
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